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15 Oct 2007 :	BlueKaizen Machine Learning Solutions now on Sun Solaris BlueKaizen MLToolkit 1.0, MASA's industrial-strength machine learning software framework, is now available on Sun Solaris 10. BlueKaizen WaferFit, MASA's leading-edge wafer surface interpolation engine, will be the first MLToolkit-based application to take advantage of the new environment, and many others will soon follow!
15 Oct 2007 :	MASA BlueKaizen exhibiting at the ISMI Symposium on Manufacturing Effectiveness (October 24-25 2007 in Austin Texas USA) MASA BlueKaizen will participate as an exhibitor to the 4th ISMI Symposium on Manufacturing Effectiveness at the Hilton Austin Airport hotel on October 24 and 25 2007. It will be the opportunity for us to demonstrate our complete solution portfolio in the areas of Process Control, Yield Management and Dynamic Optimization for the Semiconductor industry.
12 Sep 2007 :	BlueKaizen QuEst, WaferProfile, WaferFit and WaferQuality data sheets available for download MASA BlueKaizen Semiconductor division just posted the datasheets for BlueKaizen QuEst, BlueKaizen WaferProfile, BlueKaizen WaferQuality and BlueKaizen WaferFit.
11 Sep 2007 :	MASA will present BlueKaizen QuEst at Semicon Europe 2007 During Semicon Europe Show in Stuttgart Germany (9-11 October 2007) at the Stuttgart Trade Fair Center, MASA will present BlueKaizen QuEst a tool for fast and accurate calculation of control limits and capability indicators. Come and visit us at our common booth with camLine located in Hall 3, number 2828.
31 Aug 2007 :	MASA - BlueKaizen at Semicon Europe 2007 MASA - BLueKaizen will be present this year at Semicon Europe Show in Stuttgart Germany (9-11 October 2007) at the Stuttgart Trade Fair Center. We will share camLine's booth 2828 in Hall 3 and will present our common SPC solution and MASA BlueKaizen suite of semiconductor focused products. Join us at Semicon Europe.
11 Sep 2006 :	MASA presents BlueKaizen's Advanced SPC option for SPACE at camLine's annual forum, on October 17th MASA and camLine have joined their efforts to improve current SPC practices by integrating MASA BlueKaizen WaferFit and BlueKaizen WaferProfile into SPACE, camLine's leading edge product. Using a standard metrology data sample, BlueKaizen WaferFit and WaferProfile collaborate to construct virtual shape-based SPC indicators (mean, range, deviation) and compute a multivariate out-of-population model, which assigns an abnormality score to the new combination of shape indicators. During camLine’s Forum, MASA’s presentation will show the technical justification and give some implementation details on what will soon be a very valuable option for SPACE.
10 Sep 2006 :	Crolles2 Alliance (ST Microelectronics, Philips, FreeScale Semiconductors) will present some first results of MASA's BlueKaizen WaferProfile at Sematech's ISMI'2006 ISMI'2006, the 3rd ISMI Symposium on Manufacturing Effectiveness, will be held from October 9th to 11th this year at Austin, Texas. The Crolles2 Alliance, together with MASA, will present some realistic case studies concerning the application of BlueKaizen techniques to front-end manufacturing metrology data. BlueKaizen WaferProfile is a machine learning software application for generating metrology out-of-control maps and detecting abnormal metrology profiles, which cannot be detected with standard SPC indicators. Positive results obtained by applying this approach at two different process steps (Thermal Treatment and Chemical Vapor Deposition) are reported.
09 Sep 2006 :	MASA's automatic, multivariate model selection tool used by the Provence Georges Charpak Microelectronics Centre (CMP-GC) to study parameter relationships before the setup of new Run-to-Run loops at ST Microelectronics 200mm wafer fab in Rousset As the wafer fabrication process becomes more complex, apprehending phenomena with physical models sometimes becomes intractable. However, some of the relationships between the measured parameters can still by captured by learning statistical models of the process. MASA's model selection techniques allow to compare candidates from different model families and select the most accurate and robust ones. CMP-GC and MASA will present the case of a dry etch chamber run-to-run loop study at the AEC/APC Symposium XVIII to be held in Wesminster, CO from September 30th to October 5th this year.
04 Jul 2006 :	A new and improved version of MASA's original analysis tool targeted to metrology data, BlueKaizen WaferFit 1.0, is finally available BlueKaizen WaferFit is a software application that calls upon advanced statistical learning concepts to compute highly accurate metrology estimates for any non-sampled position. WaferFit can be applied to process characterization, advanced process control and yield management. Examples of applications include computing advanced shape indicators to detect problems not seen with standard SPC indicators, and aligning heterogeneous wafer mappings, allowing the computation of correlations between any sets of metrologies, parametric test, defect and yield maps. New features include multi-metrology file management, mapping edition, missing data management, additional metrology translators, improved visualization, and more. For further information on features and pricing, you may like to contact us.
20 Apr 2006 :	BlueKaizen Wafer Fit and BlueKaizen Wafer Quality data sheets available for download MASA BlueKaizen Semiconductor division just posted the datasheets for BlueKaizen WaferQuality and BlueKaizen WaferFit.
27 Mar 2006 :	Semiconductor veteran joins MASA BlueKaizen management team to increase market penetration Michel Gaouyer joins MASA as Business Unit Manager for the Semiconductor division of BlueKaizen, whose many projects are geared towards offering customers with software-based solutions for the improvement of Process Control, Metrology, Test and Yield Management for the semiconductor manufacturing. His main focus will be to leverage his 16+ years of experience in the industry to improve BlueKaizen Semiconductor Business Unit's product and solution sales strategies to include major international client accounts and OEM partners. Before joining MASA, Michel was Director, Software Services Europe for BrooksSoftware, a division of Brooks Automation Inc, where he managed several large CIM deployment projects. Prior to Brooks, Michel was Sales Manager Software for PRI Automation and spent 8 years with ST Microelectronics as IT manager for one of their facilities and then Corporate Automation Manager. Michel holds a Masters from the INSA in Rennes.
01 Mar 2006 :	ATMEL and MASA will present some first results obtained in the context of the European collaborative R&D project HYMNE at the AEC/APC European Conference to be held March 29-31th in Aix-en-Provence, France. The presentation is concerned with the extension of BlueKaizen solutions for parametric test data in front-end manufacturing. The solution that has been evaluated with success by ATMEL is based on new algorithms developed by MASA for the detection of parameter deviations and the multi-classification of deviating lots. The output of the multi-classification can be directly fed into ATMEL correlation and commonality tools. Especially when probe tests are done remotely, the possibility to run an automatic root cause search at the parametric test level could have a dramatic impact in terms of reactivity to crises and anticipation of yield losses. : Link to AEC/APC European Conference homepage
02 Nov 2005 :	MASA presented BK Industrial Waste at POLLUTEC 2005 Pollutec Paris 2005, the 21st international exhibition of environmental equipment, technologies and services took place in Paris-Nord Villepinte - France from 29th November to 2nd December 2005. MASA Group presented and demonstrated its BLueKaizen Waste Management softwares at Hall 6 Booth N133. For more information, visit POLLUTEC internet site.
12 Sep 2005 :	MASA co-develops with Philips Semiconductors, STMicroelectronics and Atmel the HYMNE Pan-European R&D project (High Yield driven MaNufacturing Excellence in sub 65 nm CMOS) In this project, carried out with Philips Semiconductors, STMicroelectronics and Atmel, MASA continues its R&D investment in the field of multivariate analysis and statistical learning technologies applied to yield improvement and statistical control of processes (SPC) in the semiconductor industry. The HYMNE project is part of the European R&D program MEDEA+ initiated by microelectronics industries and funded by selected Member States in the EUREKA Framework. The HYMNE (High Yield driven MaNufacturing Excellence in the production of sub 65-nm CMOS devices) project intends to develop methods, software and hardware that will permit the European IC manufacturing industry to enhance production cycle time and device yield and hence to significantly gain in competitiveness in sub 65 nm technologies manufacturing.
06 Sep 2005 :	ESRI invites MASA Group to present BK Industrial Waste at SIG 2005 Conference SIG 2005 is the annual major event dedicated to the uses of the geographical dimension in information systems. This year, MASA Group will present BK Industrial Waste, one of its collection routing software dedicated to Environment and Waste Services sector. See ESRI France for more information on SIG 2005 conference.
24 Aug 2005 :	FreeScale will present in October the results of its evaluation of BK Wafer Quality to Keithley's European users Keithley's European users will meet October 10th and 11th this year, at Lisbon. To this event, FreeScale Toulouse proposed to present the preliminary results of its recent evaluation of BK Wafer Quality, which is BlueKaizen's application dedicated to the multivariate treatment of parametric test data.
01 Aug 2005 :	Crolles2 Alliance (ST Microelectronics, Philips, FreeScale Semiconductors) will present together with MASA use cases of BK Wafer Fit at Sematech's ISMI'2005 Sematech's ISMI'2005 will be held October 24-26th this year at Austin, Texas. The Crolles2 Alliance (ST Microelectronics, Philips, FreeScale Semiconductors), together with MASA, will present some realistic case studies concerning the application of BlueKaizen techniques to front-end manufacturing metrology data. BK Wafer Fit is a machine learning sofware application for the accurate estimation of metrology measure values on those wafer points for which no sample measure values exist. Two usage case studies of BK Wafer Fit will be shown: the computation of advanced SPC indicators, to single out any abnormal surface profiles, as well as the root cause analysis of a defectivity problem. : Link to ISMI conference homepage
25 Jul 2005 :	Capital increase of 4.2 million euros to support international growth MASA's shareholders renew their trust in MASA by committing to a capital increase of 4.2 million euros. This funding will be used to accelerate international sales of DirectIA and BlueKaizen software suites for military, industrial and services markets.
28 Jun 2005 :	Claude Moreau joins MASA's BlueKaizen commercial team Claude Moreau joins MASA as Sales Director for BlueKaizen, whose many projects are geared towards offering customers with adaptive software-based solutions for the improvement of operational processes spanning such market sectors as those of the environment, postal services, transports and semiconductor manufacturing. Claude Moreau, a former ESSEC graduate and PhD in Computer Science, will draw upon his international experience, spanning fifteen years working with leading software companies, in order to improve BlueKaizen's product sales strategies to include major international client accounts, via OEM partners.
19 Jun 2005 :	The Crolles2 Alliance (ST Microelectronics, Philips, Freescale) finds their manufacturing processes improved thanks to BK Wafer Fit Crolles2 Alliance (ST Microelectronics, Philips, Freescale) is considering the deployment of BK Wafer Fit for the visual inspection and analysis of wafer surface profiles. Its application will result in increased productivity in the stages of front-end manufacturing at its 300mm facility.
23 May 2005 :	La Poste adopts BK Vehicle Routing for their vehicle routing demands in Ile-de-France. At the end of a Europe-wide call for tenders procedure, to which most leading software editors specialising in vehicle routing submit tender offers, La Poste's Direction du Courrier has chosen MASA for the deployment of its application SPIDER, a software system allowing for the design of regular routes for a thousand vehicles in Ile-de-France, as well as the event management of missions, trucks and drivers.
21 Apr 2005 :	ST Microelectronics joins forces with Centre de Microélectronique de Provence in a project concerning the modelling of manufacturing equipment ST Microelectronics at Rousset is collaborating with Centre de Microélectronique de Provence "Georges Charpak", based at Gardanne in France, in the application of BlueKaizen's machine learning techniques for the modelling of the expected behavior of Etching Tools, in order to predict any abnormal drifts that may be rooted in either the manufacturing process itself or the tool's aging. A key issue in this project is to determine the possibility of replacing the actual preventive maintenance policy by a predictive one.